182.2-16BB-Shijing Solar

N-type TOPCon Solar Cell

182.2-16BB

182.2-16BB N-Type TOPCon Mono-Crystalline Bifacial Solar Cell

16 busbars, 12 pads, 160 fingers

16 busbars, 12 pads, 200 fingers

130±13μm

182.2mmx182.2mm±0.5mm,φ247mm±0.5mm

+0.045%/K

-0.25%/K

-0.30%/K

High Conversion Efficiency,
Front-side efficiency ≥26%

Bifaciality≥80%

Lower LID

Exceptional PID resistance

Lower Power Temperature Coefficient

Lower sealing losses, better suited to high efficiency module

Product appearance

Front	Back

Matrix material	N-type monocrystalline silicon wafer
Dimension	182.2mm×182.2mm±0.5mm
Diagonal	Φ 247mm±0.5mm
Thickness	130±13μm
Front	16 busbars, 12 pads, 160 fingers
Back	16 busbars, 12 pads, 200 fingers

High Conversion Efficiency, front-side efficiency ≥26.5%

Bifaciality≥80%, lower LID

Exceptional PID resistance

Power temperature coefficient down to -0.30%/K

Better Performance in Low Irradiance Environment

Lower sealing losses, better suited to high efficiency module

Spectral Response	IV Curve

	Solderability
	Minimum peel strength	≥0.5N/mm
	The results may vary depending on the welding rod, welding method, and conditions

Current temperature coefficient	+0.045%/K
Voltage temperature coefficient	-0.25%/K
Power temperature coefficient	-0.30%/K

Efficiency/EFF	Maximum output power/Pmpp	Maximum power voltage/Vmpp	Maximum power current/Impp	Open-circuit voltage/Voc	Short-circuit current/Isc
%	W	V	A	V	A
25.3	8.35	0.615	13.583	0.716	14.148
25.2	8.32	0.614	13.551	0.715	14.113
25.1	8.29	0.613	13.520	0.714	14.078
25.0	8.25	0.612	13.488	0.713	14.045
24.9	8.22	0.611	13.456	0.712	14.015
24.8	8.19	0.611	13.402	0.712	13.965
24.7	8.16	0.610	13.370	0.711	13.930
24.6	8.12	0.609	13.337	0.710	13.895
24.5	8.09	0.608	13.305	0.709	13.860
24.4	8.06	0.607	13.272	0.708	13.825
24.3	8.02	0.607	13.218	0.708	13.790
24.2	7.99	0.606	13.185	0.707	13.755
24.1	7.96	0.605	13.153	0.706	13.715
24.0	7.92	0.604	13.120	0.705	13.675
23.9	7.89	0.603	13.087	0.704	13.640
STC*（Standard test conditions）:1000W/㎡, AM 1.5G, 25℃ The above technical parameters are subject to technical changes and tests.